The DF-749 provides trace and ultra-trace moisture contaminant measurements in various background gases including nitrogen, hydrogen, helium, argon and oxygen. Ideal for quality checking of UHP gases used in LCD and LED manufacture, the DF-749’s compact form makes it easily portable for easy cart or mobile use. A robust hardware/software design virtually eliminates dry down times often associated with UHP gas checking.

Offering an ultra-sensitive Lower Detection Limit (LDL) of 250ppt, this device uses industry-leading Tunable Diode Laser (TDL) sensing technology, delivering ultra-reliable baseline measurements and a fast speed of response. This analyzer is also highly affordable over product life, with a robust sensor construction that has low lifetime maintenance requirements and a zero-drift measurement stability that greatly extends calibration intervals. Factory pre-calibration also provides simplified set up.

  • Trace level Tunable Diode Laser (TDL) sensing provides high stability measurements through minimal moisture contact with optical elements
  • Broad detection range: 0-20ppm
  • Flexible configuration options: initiation via front panel/digital interconnect
  • Highly reliable with repeatable baseline measurements unaffected by loss of mirror reflectivity
  • Compact with a low weight; moves easily from port to port and ideal for other mobile applications


Sebastian Kelderman